Loading...
Bienvenue dans la collection HAL du Laboratoire Temps Espace
Derniers dépôts
-
Damien Richert, Damien Deleruyelle, José Morán-Meza, Khaled Kaja, Almazbek Imanaliev, et al.. A numerical analysis of the short open load calibration robustness for capacitance measurements in scanning microwave microscopy. Measurement Science and Technology, 2024, 36 (1), pp.015013. ⟨10.1088/1361-6501/ad7e3b⟩. ⟨hal-04814141⟩